Sunday, August 19, 2018

The first Galaxy Note 9 benchmarks show that it can not beat the iPhone X

It did not take long before the new Note 9 ended up under the magnifying glass of the various benchmark programs . In fact, Tom's guide tested the Snapdragon 845 version of the 6 GB Galaxy Note 9, using Geekbench 4 and 3DMark Slingshot Extreme 3.1.

Without further ado, here are the results of the various smartphones being compared, including the iPhone X :

Geekbench 4 multicore score:
-  iPhone X 10.357
- OnePlus 6 9.088
- Galaxy Note 9 8.876
- LG G7 ThinQ 8.566
- Galaxy S9 + 8.295
- Galaxy Note 8 6.564
- Pixel 2 XL 6.282

As the name suggests, Geekbench 4 verifies the performance of all-core load processors. The Notes 9 got a much lower ranking than the much famed iPhone X . about 8,876 points. Arriving third, behind OnePlus 6, a device with a decidedly lower cost, however, confirms an improvement over its predecessor. Reports show that we are talking about a rather significant performance ratio: over 35%. Instead, Google's flagship phone totaled only 6,282 points.

3D Mark Slingshot Extreme 3.1 :
- OnePlus 6 5.124
- iPhone 4,994
- Galaxy Note 9 4.639
- Galaxy S9 + 4,634
- LG G7 ThinQ 4,201
- Galaxy Note 8 3,710
- Pixel 2 XL 3,679

The test results are however positive
This test tries to squeeze most of the graphics chips of the devices. But even if the path of Note 9 continues to reach high summits, it is still evident a performance gap against rival iPhone X. It should be noted that the OnePlus 6 used was the 8 GB RAM version , giving it an advantage in that test . It seems above all that the Note 9 shares more than a simple visual similarity with the Galaxy S9 +, which has an almost identical result in the scores.

Let's not forget that while OnePlus 6, Note 9 and Galaxy S9 + were released this year, the iPhone X is a 2017 model , with a new one coming in just a couple of months.

Obviously, stress tests do not translate perfectly into everyday use, but still give a good idea of ​​the capabilities of different devices under similar conditions.

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